Si group
Hyuk Jin, Kim
Chungang univ. EE engineering (BS)
POSTECH, Electrical engineering (MS)
Interest : Nanoscale MOSFET reliability
4th, year of Ph, D course
hj2013@postech.ac.kr
Gi Youn, Roh
Kyungpook univ. EE engineering (BS)
POSTECH, Electrical engineering (MS)
Interest : Nanoscale MOSFET reliability
3rd, year of Ph, D course
gyroh@postech.ac.kr
Yeo Hyeok, Yun
Sungkyunkwan univ. EE engineering (BS)
POSTECH, Electrical engineering (MS)
Interest : Nanoscale MOSFET reliability
1st, year of Ph, D course
yyh519@postech.ac.kr